BIROn - Birkbeck Institutional Research Online

    Observation of fine one-dimensionally disordered layers in silicon carbide

    Barnes, Paul and Kelly, Jim and Chikusa, G.R. (1991) Observation of fine one-dimensionally disordered layers in silicon carbide. Philosophical Magazine Letters 64 (1), pp. 7-13. ISSN 0950-0839.

    [img]
    Preview
    Text
    BarnesKellyFisher.pdf

    Download (349kB) | Preview

    Abstract

    The improved resolution of synchrotron edge-topography is enabling thinner (less than 100 microns), silicon carbide crystals to be studied, and is providing a more detailed and wider database on polytype depth profiles. Fine long-period and one-dimensionally-disordered layers, 5-25 microns thick, can now be confidently resolved and are found to be very common features, often in association with high-defect density bands. These features are illustrated in this paper using three examples. A new long period polytype LPP (152H/456R) has been discovered and reported here for the first time.

    Metadata

    Item Type: Article
    Keyword(s) / Subject(s): one-dimensional disorder, polytypes, silicon carbide
    School: Birkbeck Schools and Departments > School of Science > Biological Sciences
    Depositing User: Dr. Jim Kelly
    Date Deposited: 09 Oct 2006
    Last Modified: 11 Oct 2016 12:01
    URI: http://eprints.bbk.ac.uk/id/eprint/407

    Statistics

    Downloads
    Activity Overview
    196Downloads
    234Hits

    Additional statistics are available via IRStats2.

    Archive Staff Only (login required)

    Edit/View Item Edit/View Item