Observation of fine one-dimensionally disordered layers in silicon carbide
Barnes, Paul and Kelly, Jim and Chikusa, G.R. (1991) Observation of fine one-dimensionally disordered layers in silicon carbide. Philosophical Magazine Letters 64 (1), pp. 7-13. ISSN 0950-0839.
The improved resolution of synchrotron edge-topography is enabling thinner (less than 100 microns), silicon carbide crystals to be studied, and is providing a more detailed and wider database on polytype depth profiles. Fine long-period and one-dimensionally-disordered layers, 5-25 microns thick, can now be confidently resolved and are found to be very common features, often in association with high-defect density bands. These features are illustrated in this paper using three examples. A new long period polytype LPP (152H/456R) has been discovered and reported here for the first time.
|Keyword(s) / Subject(s):||one-dimensional disorder, polytypes, silicon carbide|
|School:||Birkbeck Schools and Departments > School of Science > Biological Sciences|
|Depositing User:||Dr. Jim Kelly|
|Date Deposited:||09 Oct 2006|
|Last Modified:||11 Oct 2016 12:01|
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