Barnes, Paul and Kelly, Jim and Chikusa, G.R. (1991) Observation of fine one-dimensionally disordered layers in silicon carbide. Philosophical Magazine Letters 64 (1), pp. 7-13. ISSN 0950-0839.
|
Text
BarnesKellyFisher.pdf Download (349kB) | Preview |
Abstract
The improved resolution of synchrotron edge-topography is enabling thinner (less than 100 microns), silicon carbide crystals to be studied, and is providing a more detailed and wider database on polytype depth profiles. Fine long-period and one-dimensionally-disordered layers, 5-25 microns thick, can now be confidently resolved and are found to be very common features, often in association with high-defect density bands. These features are illustrated in this paper using three examples. A new long period polytype LPP (152H/456R) has been discovered and reported here for the first time.
Metadata
| Item Type: | Article |
|---|---|
| Keyword(s) / Subject(s): | one-dimensional disorder, polytypes, silicon carbide |
| School: | Birkbeck Faculties and Schools > Faculty of Science > School of Natural Sciences |
| Depositing User: | Dr. Jim Kelly |
| Date Deposited: | 09 Oct 2006 |
| Last Modified: | 28 Jun 2025 16:24 |
| URI: | https://eprints.bbk.ac.uk/id/eprint/407 |
Statistics
Additional statistics are available via IRStats2.
Archive Staff Only (login required)
