23 September 2015

Adly, F. and Alhussein, O. and Yoo, Paul D. and Al-Hammadi, Y. and Taha, K. and Muhaidat, S. and Jeong, Y.-S. and Lee, U. and Ismail, M. (2015) Simplified subspaced regression network for identification of defect patterns in semiconductor wafer maps. IEEE Transactions on Industrial Informatics 11 (6), pp. 1267-1276. ISSN 1551-3203.

24 October 2023

Taha, K. and Yoo, Paul and Al-Hammadi, Y. and Muhaidat, S. and Yeun, C.Y. (2023) Learning a deep-feature clustering model for gait-based individual identification. Computers and Security , ISSN 0167-4048.