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23 September 2015
Adly, F. and Alhussein, O. and Yoo, Paul D. and Al-Hammadi, Y. and Taha, K. and Muhaidat, S. and Jeong, Y.-S. and Lee, U. and Ismail, M. (2015) Simplified subspaced regression network for identification of defect patterns in semiconductor wafer maps. IEEE Transactions on Industrial Informatics 11 (6), pp. 1267-1276. ISSN 1551-3203.
30 October 2015
Al-Jarrah, O.Y. and Alhussein, O. and Yoo, Paul D. and Muhaidat, S. and Taha, K. and Kim, K. (2015) Data randomization and cluster-based partitioning for Botnet intrusion detection. IEEE Transactions on Cybernetics 46 (8), pp. 1796-1806. ISSN 2168-2267.
17 May 2023
Almahmoud, Zaid and Yoo, Paul and Alhussein, O. and Farhat, I. and Damiani, E. (2023) A holistic and proactive approach to forecasting cyber threats. Scientific Reports 13 (8049), ISSN 2045-2322.