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Liu, J. and He, L. and Dong, F. and Hudson-Edwards, Karen A. (2016) The role of nano-sized manganese coatings on bone char in removing arsenic(V) from solution: Implications for permeable reactive barrier technologies. Chemosphere 153 , pp. 146-154. ISSN 0045-6535.
He, L. and Gao, X. and Lu, W. and Li, Xuelong and Tao, D. (2011) Image quality assessment based on S-CIELAB model. Signal, Image and Video Processing 5 (3), pp. 283-290. ISSN 1863-1703.
He, L. and Lu, W. and Gao, X. and Tao, D. and Li, Xuelong (2011) A novel metric based on mca for image quality. International Journal of Wavelets, Multiresolution and Information Processing 09 (05), pp. 743-757. ISSN 0219-6913.
Sahu, M.S. and Blades, J.C. and He, L. and Hartmann, D.A.P. and Barlow, M.J. and Crawford, Ian (1998) Atomic and molecular interstellar absorption lines toward the high galactic latitude stars HD 141569 and HD 157841 at ultra-high resolution. The Astrophysical Journal 504 (1), pp. 522-532. ISSN 0004-637X.
Blades, J.C. and Sahu, M.S. and He, L. and Crawford, Ian and Barlow, M.J. and Diego, F. (1997) Ultra-high-resolution observations of interstellar Na I and Ca II toward the high-galactic latitude star HD 28497. The Astrophysical Journal 478 (2), pp. 648-657. ISSN 0004-637X.
Book Section
Gao, F. and Tao, D. and Li, Xuelong and Gao, X. and He, L. (2012) Local structure divergence index for image quality assessment. In: Huang, T. and Zeng, Z. and Li, C. and Leung, C.S. (eds.) Neural Information Processing. Berlin, Germany: Springer Verlag, pp. 337-344. ISBN 9783642345005.
He, L. and Tao, D. and Li, Xuelong and Gao, X. (2012) Sparse representation for blind image quality assessment. In: UNSPECIFIED (ed.) IEEE Conference on Computer Vision and Pattern Recognition. Washington, USA: IEEE Computer Society, pp. 1146-1153. ISBN 9781467312264.
Li, Xuelong and He, L. and Lu, W. and Gao, X. and Tao, D. (2010) A novel image quality metric based on morphological component analysis. In: UNSPECIFIED (ed.) International Conference on Systems, Man and Cybernetics. New York, USA: Institute of Electrical and Electronics Engineers, pp. 1449-1454. ISBN 9781424465866.