BIROn - Birkbeck Institutional Research Online
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    Number of items: 9.

    Taha, K. and Yoo, Paul and Eddinari, F.Z. and Nedunkulathil, S. (2021) Inferring the densest multi-profiled cross-community for a user. Knowledge-Based Systems , ISSN 0950-7051. (In Press)

    Taha, K. and Davuluri, R. and Yoo, Paul D. and Spencer, J. (2021) Personizing the prediction of future susceptibility to a specific disease. PLoS One , ISSN 1932-6203.

    Taha, K. and Yoo, Paul D. (2020) An effective disease risk indicator tool. 2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) , ISSN 2694-0604.

    Lee, S.J. and Yoo, Paul D. and Asyhari, T.A. and Jhi, Y. and Chermak, L. and Yeun, C.Y. and Taha, K. (2020) IMPACT: Impersonation attack detection via edge computing using deep autoencoder and feature abstraction. IEEE Access , ISSN 2169-3536. (In Press)

    Parker, L. and Yoo, Paul D. and Asyhari, T. and Chermak, L. and Jhi, Y. and Taha, K. (2019) DEMISe: interpretable deep extraction and mutual information selection techniques for IoT intrusion detection. In: UNSPECIFIED (ed.) ARES '19 Proceedings of the 14th International Conference on Availability, Reliability and Security. ACM. ISBN 9781450371643.

    Tsimperidis, I. and Yoo, Paul D. and Taha, K. and Mylonas, A. and Katos, V. (2018) R2BN: an adaptive model for keystroke-dynamics-based educational level classification. IEEE Transactions on Cybernetics , pp. 1-11. ISSN 2168-2267.

    Taha, K. and Yoo, Paul D. (2016) Using the spanning tree of a criminal network for identifying its leaders. IEEE Transactions on Information Forensics and Security 12 (2), pp. 445-453. ISSN 1556-6013.

    Al-Jarrah, O.Y. and Alhussein, O. and Yoo, Paul D. and Muhaidat, S. and Taha, K. and Kim, K. (2015) Data randomization and cluster-based partitioning for Botnet intrusion detection. IEEE Transactions on Cybernetics 46 (8), pp. 1796-1806. ISSN 2168-2267.

    Adly, F. and Alhussein, O. and Yoo, Paul D. and Al-Hammadi, Y. and Taha, K. and Muhaidat, S. and Jeong, Y.-S. and Lee, U. and Ismail, M. (2015) Simplified subspaced regression network for identification of defect patterns in semiconductor wafer maps. IEEE Transactions on Industrial Informatics 11 (6), pp. 1267-1276. ISSN 1551-3203.

    This list was generated on Thu Jan 20 06:03:57 2022 GMT.