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Al Hamadi, A. and Yeun, C.Y. and Damiani, E. and Yoo, Paul D. and Hu, J. and Yeun, H.K. and Yim, M.-S. (2021) Explainable Artificial Intelligence to evaluate industrial internal security using EEG signals in IoT Framework. Ad Hoc Networks 123 (102641), ISSN 1570-8705.

Al Alkeem, E. and Yeun, C.Y. and Yun, J. and Yoo, Paul D. and Chae, M. and Rahman, A. and Asyhari, A.T. (2021) Robust deep identification using ECG and multimodal biometrics for Industrial Internet of Things. Ad Hoc Networks 121 (102581), ISSN 1570-8705.

Taha, K. and Davuluri, R. and Yoo, Paul D. and Spencer, J. (2021) Personizing the prediction of future susceptibility to a specific disease. PLoS One , ISSN 1932-6203.

Al Hammadi, A. and Lee, D. and Yeun, C.Y. and Damiani, E. and Kim, S.-k. and Yoo, Paul D. and Choi, H.-j. (2020) Novel EEG sensor-based risk framework for the detection of insider threats in safety critical industrial infrastructure. IEEE Access 8 , pp. 206222-206234. ISSN 2169-3536.

Taha, K. and Yoo, Paul D. (2020) An effective disease risk indicator tool. 2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) , ISSN 2694-0604.

Lee, S.J. and Yoo, Paul D. and Asyhari, T.A. and Jhi, Y. and Chermak, L. and Yeun, C.Y. and Taha, K. (2020) IMPACT: Impersonation attack detection via edge computing using deep autoencoder and feature abstraction. IEEE Access 8 , pp. 65520-65529. ISSN 2169-3536.

Kim, S.-k. and Yeun, C.Y. and Yoo, Paul D. (2019) An enhanced machine learning-based biometric authentication system using RR- Interval Framed Electrocardiograms. IEEE Access 7 , 168669 -168674. ISSN 2169-3536.

Li, M. and Selim, B. and Muhaidat, S. and Sofotasios, P. and Dianati, M. and Yoo, Paul D. and Liang, J. and Wang, A. (2019) Effects of residual hardware impairments on secure NOMA-based cooperative systems. IEEE Access 4 , ISSN 2169-3536.

Parker, L. and Yoo, Paul D. and Asyhari, T. and Chermak, L. and Jhi, Y. and Taha, K. (2019) DEMISe: interpretable deep extraction and mutual information selection techniques for IoT intrusion detection. In: UNSPECIFIED (ed.) ARES '19 Proceedings of the 14th International Conference on Availability, Reliability and Security. ACM. ISBN 9781450371643.

Al Alkeem, E. and Kim, S.-K. and Yeun, C.Y. and Zemerly, J. and Poon, K. and Yoo, Paul D. (2019) An Enhanced Electrocardiogram biometric authentication system using machine learning. IEEE Access 7 , pp. 123069-123075. ISSN 2169-3536.

Yoo, Paul D. (2019) Popularity-based video caching techniques for cache-enabled networks: a survey. IEEE Access 7 , pp. 27699-27719. ISSN 2169-3536.

Yoo, Paul D. (2019) Censor-based cooperative Multi-Antenna Spectrum Sensing with Imperfect Reporting Channels. IEEE Transactions on Sustainable Computing 5 (1), pp. 48-60. ISSN 2377-3782.

Yoo, Paul D. (2019) Shortlisting the influential members of criminal organizations and identifying their important communication channels. IEEE Transactions on Information Forensics and Security , ISSN 1556-6013.

Tsimperidis, I. and Yoo, Paul D. and Taha, K. and Mylonas, A. and Katos, V. (2018) R2BN: an adaptive model for keystroke-dynamics-based educational level classification. IEEE Transactions on Cybernetics , pp. 1-11. ISSN 2168-2267.

Aminanto, M.E. and Choi, R. and Tanuwidjaja, H.C. and Yoo, Paul D. and Kim, K. (2017) Deep abstraction and weighted feature selection for Wi-Fi impersonation detection. IEEE Transactions on Information Forensics and Security 13 (3), pp. 621-636. ISSN 1556-6013.

Taha, K. and Yoo, Paul D. (2016) Using the spanning tree of a criminal network for identifying its leaders. IEEE Transactions on Information Forensics and Security 12 (2), pp. 445-453. ISSN 1556-6013.

Al-Jarrah, O.Y. and Alhussein, O. and Yoo, Paul D. and Muhaidat, S. and Taha, K. and Kim, K. (2015) Data randomization and cluster-based partitioning for Botnet intrusion detection. IEEE Transactions on Cybernetics 46 (8), pp. 1796-1806. ISSN 2168-2267.

Adly, F. and Alhussein, O. and Yoo, Paul D. and Al-Hammadi, Y. and Taha, K. and Muhaidat, S. and Jeong, Y.-S. and Lee, U. and Ismail, M. (2015) Simplified subspaced regression network for identification of defect patterns in semiconductor wafer maps. IEEE Transactions on Industrial Informatics 11 (6), pp. 1267-1276. ISSN 1551-3203.