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    Kelly, Jim and Fisher, G.R. and Barnes, Paul (2005) Correlation between layer thickness and periodicity of long polytypes in silicon carbide. Materials Research Bulletin 40 (2), pp. 249-255. ISSN 0025-5408.

    Kelly, Jim (2001) Computing and teaching microsymposia at ECM [European Crystallographic Meeting 20, Krakow, August 2001]. Crystallography News 79 , pp. 26-27. ISSN 1467-2790.

    Kelly, Jim (2000) British Crystallographic Association Spring meeting, Heriot Watt University, 5 April 2000. Meeting report: Controlled environment XRD. British Crystallographic Association, Industrial Group, London.

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